The Micron Optics FFP-SI Fiber Fabry-Perot Scanning Interferometer is a lensless, plane Fabry- Perot interferometer with a single-mode fiber waveguide between two highly reflective multi- layer mirrors that are deposited directly onto optical fibers.
Fiber Fabry-Perot Scanning Interferometer | FFP-SI
The Micron Optics FFP-SI Fiber Fabry-Perot Scanning Interferometer is a lensless, plane Fabry-Perot Interferometer with a single-mode fiber waveguide between two highly reflective multi-layer mirrors that are deposited directly onto optical fibers.
The FFP-SI’s cavity consists entirely of fiber waveguide, permitting an extremely wide range of possible Free Spectral Ranges (FSRs), and no alignment or mode-matching is required.
Wavelength scanning is achieved by axially straining a short section of fiber inside the cavity using a stacked piezoelectric actuator. Scanning frequencies to 100 Hz and higher can provide direct measurement of transient optical phenomenon such as laser chirp and jitter. Stable and repeatable scanning over longer periods of time can provide direct measurement of slowly varying optical phenomenon such as laser drift.
For driving the FFP-SI, the FFP Controller (FFP-C) provides simple electrical signals for wavelength scanning and wavelength selection in either open or closed-loop mode. Many spectral measurements can be made using only an FFP-SI, FFP-C and oscilloscope. Also the FFP-SI can be cascaded with other FFP-SIs or FFP-TFs to provide ultra-high finesse values. In general, FFP-SIs are sensitive to the input polarization of the optical signal. Since polarization properties of the FFP-SI are stable, an input polarization controller can be used to tune to one polarization or to perform polarization analysis.
- Customizable center wavelength, free spectral range, finesse & bandwidth
- High direct optical resolution
- Low fiber-to-fiber insertion loss
- Convenient wavelength locking
- Small footprint
- Vibration and shock resistant
- No alignment required
- Wavelength ranges from 800 to 1600 nm
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- Ultra high resolution laser analysis
- Ultra high resolution spectroscopy
- Laser Mode control and selection
- Tunable fiber lasers
- Polarization analysis